Fundamental aspects of Arn+ SIMS profiling of common organic semiconductors

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Authors

Fleischmann, Claudia; Conard, Thierry; Havelund, Rasmus; Franquet, Alexis; Poleunis, Claude; Voroshazi, Eszter; Delcorte, Arnaud; Vandervorst, Wilfried

ISSN

0142-2421

Issue

S1

Journal

Surface and Interface Analysis

Volume

46

Title

Fundamental aspects of Arn+ SIMS profiling of common organic semiconductors

Publication type

Journal article

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