dc.contributor.author | Franco, Jacopo | |
dc.contributor.author | Alian, AliReza | |
dc.contributor.author | Kaczer, Ben | |
dc.contributor.author | Lin, Dennis | |
dc.contributor.author | Ivanov, Tsvetan | |
dc.contributor.author | Pourghaderi, Mohammad Ali | |
dc.contributor.author | Martens, Koen | |
dc.contributor.author | Mols, Yves | |
dc.contributor.author | Zhou, Daisy | |
dc.contributor.author | Waldron, Niamh | |
dc.contributor.author | Sioncke, Sonja | |
dc.contributor.author | Kauerauf, Thomas | |
dc.contributor.author | Collaert, Nadine | |
dc.contributor.author | Thean, Aaron | |
dc.contributor.author | Heyns, Marc | |
dc.contributor.author | Groeseneken, Guido | |
dc.date.accessioned | 2021-10-22T01:31:02Z | |
dc.date.available | 2021-10-22T01:31:02Z | |
dc.date.issued | 2014 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/23828 | |
dc.source | IIOimport | |
dc.title | Suitability of high-k gate oxides for III-V devices: a PBTI study in In0.53 Ga0.47As devices with Al2O3 | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Franco, Jacopo | |
dc.contributor.imecauthor | Alian, AliReza | |
dc.contributor.imecauthor | Kaczer, Ben | |
dc.contributor.imecauthor | Lin, Dennis | |
dc.contributor.imecauthor | Ivanov, Tsvetan | |
dc.contributor.imecauthor | Martens, Koen | |
dc.contributor.imecauthor | Mols, Yves | |
dc.contributor.imecauthor | Zhou, Daisy | |
dc.contributor.imecauthor | Waldron, Niamh | |
dc.contributor.imecauthor | Collaert, Nadine | |
dc.contributor.imecauthor | Thean, Aaron | |
dc.contributor.imecauthor | Heyns, Marc | |
dc.contributor.imecauthor | Groeseneken, Guido | |
dc.contributor.orcidimec | Franco, Jacopo::0000-0002-7382-8605 | |
dc.contributor.orcidimec | Kaczer, Ben::0000-0002-1484-4007 | |
dc.contributor.orcidimec | Ivanov, Tsvetan::0000-0003-3407-2742 | |
dc.contributor.orcidimec | Martens, Koen::0000-0001-7135-5536 | |
dc.contributor.orcidimec | Collaert, Nadine::0000-0002-8062-3165 | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 6A.2.1 | |
dc.source.endpage | 6A.2.6 | |
dc.source.conference | International Reliability Physics Symposium - IRPS | |
dc.source.conferencedate | 8/06/2014 | |
dc.source.conferencelocation | Waikoloa, HI USA | |
dc.identifier.url | http://ieeexplore.ieee.org/xpl/articleDetails.jsp?tp=&arnumber=6861098&contentType=Conference+Publications | |
imec.availability | Published - open access | |