Authors

Franco, Jacopo; Alian, AliReza; Kaczer, Ben; Lin, Dennis; Ivanov, Tsvetan; Pourghaderi, Mohammad Ali; Martens, Koen; Mols, Yves; Zhou, Daisy; Waldron, Niamh; Sioncke, Sonja; Kauerauf, Thomas; Collaert, Nadine; Thean, Aaron; Heyns, Marc; Groeseneken, Guido

Conference

International Reliability Physics Symposium - IRPS

Title

Suitability of high-k gate oxides for III-V devices: a PBTI study in In0.53 Ga0.47As devices with Al2O3

Publication type

Proceedings paper

Embargo date

9999-12-31