Reliability challenges of high mobility channel technologies: SiGe, Ge and InGaAs

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Authors
Franco, Jacopo; Kaczer, Ben; Roussel, Philippe; Cho, Moon Ju; Grasser, Tibor; Arimura, Hiroaki; Cott, Daire; Mitard, Jerome; Witters, Liesbeth; Waldron, Niamh; Zhou, Daisy; Alian, AliReza; Vais, Abhitosh; Lin, Dennis; Martens, Koen; Pourghaderi, Mohammad Ali; Sioncke, Sonja; Collaert, Nadine; Thean, Aaron; Heyns, Marc; Groeseneken, Guido
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IEEE Semiconductor Interface Specialists Conference - SISC
Title
Reliability challenges of high mobility channel technologies: SiGe, Ge and InGaAs
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Meeting abstract
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