Publication:

BTI reliability of high-mobility channel devices: SiGe, Ge and InGaAs

Date

2014
Proceedings Paper
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Author(s)

Franco, Jacopo  
;
Kaczer, Ben  
;
Roussel, Philippe  
;
Cho, Moon Ju
;
Grasser, Tibor
;
Mitard, Jerome  
;
Arimura, Hiroaki  
;
Witters, Liesbeth  
;
Cott, Daire  
;
Waldron, Niamh  
;
Zhou, Daisy  
;
Vais, Abhitosh  
;
Lin, Dennis  
;
Alian, AliReza  
;
Pourghaderi, Mohammad Ali
;
Martens, Koen  
;
Sioncke, Sonja
;
Collaert, Nadine  
;
Thean, Aaron  
;
Heyns, Marc  
;
Groeseneken, Guido  

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1996 since deposited on 2021-10-22
1last month
Acq. date: 2026-05-19

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