dc.contributor.author | Franco, Jacopo | |
dc.contributor.author | Kaczer, Ben | |
dc.contributor.author | Roussel, Philippe | |
dc.contributor.author | Cho, Moon Ju | |
dc.contributor.author | Grasser, Tibor | |
dc.contributor.author | Mitard, Jerome | |
dc.contributor.author | Arimura, Hiroaki | |
dc.contributor.author | Witters, Liesbeth | |
dc.contributor.author | Cott, Daire | |
dc.contributor.author | Waldron, Niamh | |
dc.contributor.author | Zhou, Daisy | |
dc.contributor.author | Vais, Abhitosh | |
dc.contributor.author | Lin, Dennis | |
dc.contributor.author | Alian, AliReza | |
dc.contributor.author | Pourghaderi, Mohammad Ali | |
dc.contributor.author | Martens, Koen | |
dc.contributor.author | Sioncke, Sonja | |
dc.contributor.author | Collaert, Nadine | |
dc.contributor.author | Thean, Aaron | |
dc.contributor.author | Heyns, Marc | |
dc.contributor.author | Groeseneken, Guido | |
dc.date.accessioned | 2021-10-22T01:31:54Z | |
dc.date.available | 2021-10-22T01:31:54Z | |
dc.date.issued | 2014 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/23831 | |
dc.source | IIOimport | |
dc.title | BTI reliability of high-mobility channel devices: SiGe, Ge and InGaAs | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Franco, Jacopo | |
dc.contributor.imecauthor | Kaczer, Ben | |
dc.contributor.imecauthor | Roussel, Philippe | |
dc.contributor.imecauthor | Mitard, Jerome | |
dc.contributor.imecauthor | Arimura, Hiroaki | |
dc.contributor.imecauthor | Witters, Liesbeth | |
dc.contributor.imecauthor | Cott, Daire | |
dc.contributor.imecauthor | Waldron, Niamh | |
dc.contributor.imecauthor | Zhou, Daisy | |
dc.contributor.imecauthor | Vais, Abhitosh | |
dc.contributor.imecauthor | Lin, Dennis | |
dc.contributor.imecauthor | Alian, AliReza | |
dc.contributor.imecauthor | Martens, Koen | |
dc.contributor.imecauthor | Collaert, Nadine | |
dc.contributor.imecauthor | Thean, Aaron | |
dc.contributor.imecauthor | Heyns, Marc | |
dc.contributor.imecauthor | Groeseneken, Guido | |
dc.contributor.orcidimec | Franco, Jacopo::0000-0002-7382-8605 | |
dc.contributor.orcidimec | Kaczer, Ben::0000-0002-1484-4007 | |
dc.contributor.orcidimec | Roussel, Philippe::0000-0002-0402-8225 | |
dc.contributor.orcidimec | Mitard, Jerome::0000-0002-7422-079X | |
dc.contributor.orcidimec | Vais, Abhitosh::0000-0002-0317-7720 | |
dc.contributor.orcidimec | Martens, Koen::0000-0001-7135-5536 | |
dc.contributor.orcidimec | Collaert, Nadine::0000-0002-8062-3165 | |
dc.source.peerreview | yes | |
dc.source.beginpage | na | |
dc.source.conference | IEEE Integrated International Reliability Workshop - IIRW | |
dc.source.conferencedate | 12/10/2014 | |
dc.source.conferencelocation | South Lake Taho, CA USA | |
imec.availability | Published - imec | |