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Investigation of nanoscopic controlled material removal by doped diamond tips for semiconductor device analysis
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Authors
Gomes, Oliver
;
Hantschel, Thomas
;
Pierre, E.
;
Vandervorst, Wilfried
Conference
European Symposium on Friction, Wear and Wear Resistance
Title
Investigation of nanoscopic controlled material removal by doped diamond tips for semiconductor device analysis
Publication type
Oral presentation
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