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Investigation of nanoscopic controlled material removal by doped diamond tips for semiconductor device analysis
Publication:
Investigation of nanoscopic controlled material removal by doped diamond tips for semiconductor device analysis
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Date
2014
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Gomes, Oliver
;
Hantschel, Thomas
;
Pierre, E.
;
Vandervorst, Wilfried
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1887
since deposited on 2021-10-22
Acq. date: 2026-01-07
Citations
Metrics
Views
1887
since deposited on 2021-10-22
Acq. date: 2026-01-07
Citations