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Characterization and modeling of charge trapping: From single defects to devices

dc.contributor.authorGrasser, T.
dc.contributor.authorRzepa, G.
dc.contributor.authorWaltl, M.
dc.contributor.authorGoes, W.
dc.contributor.authorRott, K.
dc.contributor.authorRott, G.
dc.contributor.authorReisinger, H.
dc.contributor.authorFranco, Jacopo
dc.contributor.authorKaczer, Ben
dc.date.accessioned2021-10-22T01:44:23Z
dc.date.available2021-10-22T01:44:23Z
dc.date.issued2014
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/23881
dc.sourceIIOimport
dc.titleCharacterization and modeling of charge trapping: From single defects to devices
dc.typeProceedings paper
dc.contributor.imecauthorFranco, Jacopo
dc.contributor.imecauthorKaczer, Ben
dc.contributor.orcidimecFranco, Jacopo::0000-0002-7382-8605
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.source.peerreviewyes
dc.source.beginpage1
dc.source.endpage4
dc.source.conferenceIEEE International Conference on IC Design & Technology - ICICDT
dc.source.conferencedate28/05/2014
dc.source.conferencelocationAustin, TX USA
dc.identifier.urlhttp://dx.doi.org/10.1109/ICICDT.2014.6838620
imec.availabilityPublished - imec


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