Publication:

BTI reliability of advanced gate stacks for beyond silicon devices: challenges and opportunities

Date

2014-12
Proceedings Paper
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Author(s)

Groeseneken, Guido  
;
Franco, Jacopo  
;
Cho, Moon Ju
;
Kaczer, Ben  
;
Toledano Luque, Maria
;
Roussel, Philippe  
;
Kauerauf, Thomas
;
Alian, AliReza  
;
Mitard, Jerome  
;
Arimura, Hiroaki  
;
Lin, Dennis  
;
Waldron, Niamh  
;
Sioncke, Sonja
;
Witters, Liesbeth  
;
Mertens, Hans  
;
Ragnarsson, Lars-Ake  
;
Heyns, Marc  
;
Collaert, Nadine  
;
Thean, Aaron  
;
Steegen, An

Journal

Abstract

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1987 since deposited on 2021-10-22
1last month
Acq. date: 2026-01-07

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