dc.contributor.author | Groeseneken, Guido | |
dc.contributor.author | Franco, Jacopo | |
dc.contributor.author | Cho, Moon Ju | |
dc.contributor.author | Kaczer, Ben | |
dc.contributor.author | Toledano Luque, Maria | |
dc.contributor.author | Roussel, Philippe | |
dc.contributor.author | Kauerauf, Thomas | |
dc.contributor.author | Alian, AliReza | |
dc.contributor.author | Mitard, Jerome | |
dc.contributor.author | Arimura, Hiroaki | |
dc.contributor.author | Lin, Dennis | |
dc.contributor.author | Waldron, Niamh | |
dc.contributor.author | Sioncke, Sonja | |
dc.contributor.author | Witters, Liesbeth | |
dc.contributor.author | Mertens, Hans | |
dc.contributor.author | Ragnarsson, Lars-Ake | |
dc.contributor.author | Heyns, Marc | |
dc.contributor.author | Collaert, Nadine | |
dc.contributor.author | Thean, Aaron | |
dc.contributor.author | Steegen, An | |
dc.date.accessioned | 2021-10-22T01:45:02Z | |
dc.date.available | 2021-10-22T01:45:02Z | |
dc.date.issued | 2014-12 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/23883 | |
dc.source | IIOimport | |
dc.title | BTI reliability of advanced gate stacks for beyond silicon devices: challenges and opportunities | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Groeseneken, Guido | |
dc.contributor.imecauthor | Franco, Jacopo | |
dc.contributor.imecauthor | Kaczer, Ben | |
dc.contributor.imecauthor | Roussel, Philippe | |
dc.contributor.imecauthor | Alian, AliReza | |
dc.contributor.imecauthor | Mitard, Jerome | |
dc.contributor.imecauthor | Arimura, Hiroaki | |
dc.contributor.imecauthor | Lin, Dennis | |
dc.contributor.imecauthor | Waldron, Niamh | |
dc.contributor.imecauthor | Witters, Liesbeth | |
dc.contributor.imecauthor | Mertens, Hans | |
dc.contributor.imecauthor | Ragnarsson, Lars-Ake | |
dc.contributor.imecauthor | Heyns, Marc | |
dc.contributor.imecauthor | Collaert, Nadine | |
dc.contributor.imecauthor | Thean, Aaron | |
dc.contributor.orcidimec | Franco, Jacopo::0000-0002-7382-8605 | |
dc.contributor.orcidimec | Kaczer, Ben::0000-0002-1484-4007 | |
dc.contributor.orcidimec | Roussel, Philippe::0000-0002-0402-8225 | |
dc.contributor.orcidimec | Mitard, Jerome::0000-0002-7422-079X | |
dc.contributor.orcidimec | Ragnarsson, Lars-Ake::0000-0003-1057-8140 | |
dc.contributor.orcidimec | Collaert, Nadine::0000-0002-8062-3165 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 828 | |
dc.source.endpage | 831 | |
dc.source.conference | International Electron Device Meeting - IEDM | |
dc.source.conferencedate | 15/12/2014 | |
dc.source.conferencelocation | San Francisco, CA USA | |
imec.availability | Published - imec | |