Profiling of border traps at GeSn and high-K oxide interface

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Authors
Gupta, Somya; Simoen, Eddy; Dobri, Adam; Vrielinck, Henk; Lauwaert, Johan; Merckling, Clement; Gencarelli, Federica; Shimura, Yosuke; Loo, Roger; Heyns, Marc
Conference
ECS 2014 Fall Meeting, Symposium P3: High Purity and High Mobility Semiconductors 13
Title
Profiling of border traps at GeSn and high-K oxide interface
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Meeting abstract
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