Publication:

Physical origin of current collapse in Au-free AlGaN/GaN Schottky barrier diodes

Date

2014

Journal article

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Author(s)

;

Stoffels, Steve

;

;

;

Venegas, Rafael

;

;

Bakeroot, Benoit

;

Groeseneken, Guido

;

Decoutere, Stefaan

Journal

Microelectronics Reliability

Statistics

1834 since deposited on 2021-10-22

Acq. date: 2026-02-28