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A single device based Voltage Step Stress (VSS) technique for fast reliability screening

dc.contributor.authorJi, Z.
dc.contributor.authorZhang, J. F.
dc.contributor.authorZhang, W. D.
dc.contributor.authorZhang, X.
dc.contributor.authorKaczer, Ben
dc.contributor.authorDe Gendt, Stefan
dc.contributor.authorGroeseneken, Guido
dc.contributor.authorRen, P.
dc.contributor.authorWang, R.
dc.contributor.authorHuang, R.
dc.date.accessioned2021-10-22T02:20:47Z
dc.date.available2021-10-22T02:20:47Z
dc.date.issued2014
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/24008
dc.sourceIIOimport
dc.titleA single device based Voltage Step Stress (VSS) technique for fast reliability screening
dc.typeProceedings paper
dc.contributor.imecauthorKaczer, Ben
dc.contributor.imecauthorDe Gendt, Stefan
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.contributor.orcidimecDe Gendt, Stefan::0000-0003-3775-3578
dc.source.peerreviewyes
dc.source.beginpageGD.2
dc.source.conferenceInternational Reliability Physics Symposium - IRPS
dc.source.conferencedate1/06/2014
dc.source.conferencelocationWaikoloa, HI USA
dc.identifier.urlhttp://dx.doi.org/10.1109/IRPS.2014.6861145
imec.availabilityPublished - imec


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