Bias temperature instability analysis of FinFET based SRAM cells

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Authors
Khan, Seyab; Agbo, Innocent; Hamdioui, Said; Kukner, Halil; Kaczer, Ben; Raghavan, Praveen; Catthoor, Francky
Conference
Design, Automation and Test in Europe Conference - DATE
Title
Bias temperature instability analysis of FinFET based SRAM cells
Publication type
Proceedings paper
Embargo date
9999-12-31
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