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Bias temperature instability analysis of FinFET based SRAM cells

dc.contributor.authorKhan, Seyab
dc.contributor.authorAgbo, Innocent
dc.contributor.authorHamdioui, Said
dc.contributor.authorKukner, Halil
dc.contributor.authorKaczer, Ben
dc.contributor.authorRaghavan, Praveen
dc.contributor.authorCatthoor, Francky
dc.date.accessioned2021-10-22T02:36:06Z
dc.date.available2021-10-22T02:36:06Z
dc.date.issued2014
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/24055
dc.sourceIIOimport
dc.titleBias temperature instability analysis of FinFET based SRAM cells
dc.typeProceedings paper
dc.contributor.imecauthorKaczer, Ben
dc.contributor.imecauthorCatthoor, Francky
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.contributor.orcidimecCatthoor, Francky::0000-0002-3599-8515
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage1
dc.source.endpage6
dc.source.conferenceDesign, Automation and Test in Europe Conference - DATE
dc.source.conferencedate24/03/2014
dc.source.conferencelocationDresden Germany
dc.identifier.urlhttp://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=6800245
imec.availabilityPublished - open access


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