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Degradation analysis of datapath logic subblocks under NBTI aging in FinFET technology

dc.contributor.authorKukner, Halil
dc.contributor.authorKhatib, Moustafa
dc.contributor.authorMorrison, Sebastien
dc.contributor.authorWeckx, Pieter
dc.contributor.authorRaghavan, Praveen
dc.contributor.authorKaczer, Ben
dc.contributor.authorCatthoor, Francky
dc.contributor.authorVan der Perre, Liesbet
dc.contributor.authorLauwereins, Rudy
dc.contributor.authorGroeseneken, Guido
dc.date.accessioned2021-10-22T02:42:31Z
dc.date.available2021-10-22T02:42:31Z
dc.date.issued2014
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/24074
dc.sourceIIOimport
dc.titleDegradation analysis of datapath logic subblocks under NBTI aging in FinFET technology
dc.typeProceedings paper
dc.contributor.imecauthorMorrison, Sebastien
dc.contributor.imecauthorWeckx, Pieter
dc.contributor.imecauthorKaczer, Ben
dc.contributor.imecauthorCatthoor, Francky
dc.contributor.imecauthorLauwereins, Rudy
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.contributor.orcidimecCatthoor, Francky::0000-0002-3599-8515
dc.contributor.orcidimecLauwereins, Rudy::0000-0002-3861-0168
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage473
dc.source.endpage479
dc.source.conference15th International Symposium on Quality Electronic Design - ISQED
dc.source.conferencedate3/03/2014
dc.source.conferencelocationSanta Clara, CA USA
dc.identifier.urlhttp://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=6783362
imec.availabilityPublished - open access


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