Degradation analysis of datapath logic subblocks under NBTI aging in FinFET technology

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Authors
Kukner, Halil; Khatib, Moustafa; Morrison, Sebastien; Weckx, Pieter; Raghavan, Praveen; Kaczer, Ben; Catthoor, Francky; Van der Perre, Liesbet; Lauwereins, Rudy; Groeseneken, Guido
Conference
15th International Symposium on Quality Electronic Design - ISQED
Title
Degradation analysis of datapath logic subblocks under NBTI aging in FinFET technology
Publication type
Proceedings paper
Embargo date
9999-12-31
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