Publication:

Degradation analysis of datapath logic subblocks under NBTI aging in FinFET technology

Date

2014

Proceedings Paper

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Files

27497.pdf 1.03 MB

Author(s)

;

Khatib, Moustafa

;

Morrison, Sebastien

;

;

Raghavan, Praveen

;

;

Catthoor, Francky

;

Van der Perre, Liesbet

;

Lauwereins, Rudy

;

Groeseneken, Guido

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Acq. date: 2026-08-08