Publication:

Degradation analysis of datapath logic subblocks under NBTI aging in FinFET technology

Date

2014
Proceedings Paper
Simple item page Full metadata Statistics
 
dc.contributor.authorKukner, Halil
dc.contributor.authorKhatib, Moustafa
dc.contributor.authorMorrison, Sebastien
dc.contributor.authorWeckx, Pieter
dc.contributor.authorRaghavan, Praveen
dc.contributor.authorKaczer, Ben
dc.contributor.authorCatthoor, Francky
dc.contributor.authorVan der Perre, Liesbet
dc.contributor.authorLauwereins, Rudy
dc.contributor.authorGroeseneken, Guido
dc.contributor.imecauthorMorrison, Sebastien
dc.contributor.imecauthorWeckx, Pieter
dc.contributor.imecauthorKaczer, Ben
dc.contributor.imecauthorCatthoor, Francky
dc.contributor.imecauthorLauwereins, Rudy
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.contributor.orcidimecCatthoor, Francky::0000-0002-3599-8515
dc.contributor.orcidimecLauwereins, Rudy::0000-0002-3861-0168
dc.date.accessioned2021-10-22T02:42:31Z
dc.date.available2021-10-22T02:42:31Z
dc.date.embargo9999-12-31
dc.date.issued2014
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/24074
dc.identifier.urlhttp://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=6783362
dc.source.beginpage473
dc.source.conference15th International Symposium on Quality Electronic Design - ISQED
dc.source.conferencedate3/03/2014
dc.source.conferencelocationSanta Clara, CA USA
dc.source.endpage479
dc.title

Degradation analysis of datapath logic subblocks under NBTI aging in FinFET technology

dc.typeProceedings paper
dspace.entity.typePublication
Files

Original bundle

Name:
27497.pdf
Size:
1.03 MB
Format:
Adobe Portable Document Format
Download
Publication available in collections:
Conference contributions