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Degradation analysis of datapath logic subblocks under NBTI aging in FinFET technology
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Degradation analysis of datapath logic subblocks under NBTI aging in FinFET technology
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Date
2014
Proceedings Paper
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Kukner, Halil
;
Khatib, Moustafa
;
Morrison, Sebastien
;
Weckx, Pieter
;
Raghavan, Praveen
;
Kaczer, Ben
;
Catthoor, Francky
;
Van der Perre, Liesbet
;
Lauwereins, Rudy
;
Groeseneken, Guido
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Views
1908
since deposited on 2021-10-22
3
last month
1
last week
Acq. date: 2025-12-16
Citations