Publication:

Degradation analysis of datapath logic subblocks under NBTI aging in FinFET technology

Date

2014

Proceedings Paper

Simple item page Full metadata Statistics

Files

27497.pdf 1.03 MB

Author(s)

;

Khatib, Moustafa

;

Morrison, Sebastien

;

;

Raghavan, Praveen

;

;

Catthoor, Francky

;

Van der Perre, Liesbet

;

Lauwereins, Rudy

;

Groeseneken, Guido

Statistics

1912 since deposited on 2021-10-22

1last month

Acq. date: 2026-03-16