Authors

Kukner, Halil; Weckx, Pieter; Franco, Jacopo; Toledano Luque, Maria; Cho, Moon Ju; Kaczer, Ben; Raghavan, Praveen; Jang, Doyoung; Miyaguchi, Kenichi; Garcia Bardon, Marie; Catthoor, Francky; Van der Perre, Liesbet; Lauwereins, Rudy; Groeseneken, Guido

Conference

International Reliability Physics Symposium - IRPS

Title

Scaling of BTI reliability in presence of Time-zero Variability – Pathfinding from planar FET to advanced 3-D FinFET nodes

Publication type

Proceedings paper

Embargo date

9999-12-31