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Scaling of BTI reliability in presence of Time-zero Variability – Pathfinding from planar FET to advanced 3-D FinFET nodes

dc.contributor.authorKukner, Halil
dc.contributor.authorWeckx, Pieter
dc.contributor.authorFranco, Jacopo
dc.contributor.authorToledano Luque, Maria
dc.contributor.authorCho, Moon Ju
dc.contributor.authorKaczer, Ben
dc.contributor.authorRaghavan, Praveen
dc.contributor.authorJang, Doyoung
dc.contributor.authorMiyaguchi, Kenichi
dc.contributor.authorGarcia Bardon, Marie
dc.contributor.authorCatthoor, Francky
dc.contributor.authorVan der Perre, Liesbet
dc.contributor.authorLauwereins, Rudy
dc.contributor.authorGroeseneken, Guido
dc.date.accessioned2021-10-22T02:42:56Z
dc.date.available2021-10-22T02:42:56Z
dc.date.issued2014
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/24075
dc.sourceIIOimport
dc.titleScaling of BTI reliability in presence of Time-zero Variability – Pathfinding from planar FET to advanced 3-D FinFET nodes
dc.typeProceedings paper
dc.contributor.imecauthorWeckx, Pieter
dc.contributor.imecauthorFranco, Jacopo
dc.contributor.imecauthorKaczer, Ben
dc.contributor.imecauthorJang, Doyoung
dc.contributor.imecauthorMiyaguchi, Kenichi
dc.contributor.imecauthorGarcia Bardon, Marie
dc.contributor.imecauthorCatthoor, Francky
dc.contributor.imecauthorLauwereins, Rudy
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.orcidimecFranco, Jacopo::0000-0002-7382-8605
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.contributor.orcidimecMiyaguchi, Kenichi::0000-0002-7073-6457
dc.contributor.orcidimecCatthoor, Francky::0000-0002-3599-8515
dc.contributor.orcidimecLauwereins, Rudy::0000-0002-3861-0168
dc.contributor.orcidimecGarcia Bardon, Marie::0000-0001-5772-5406
dc.contributor.orcidimecGroeseneken, Guido::0000-0003-3763-2098
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpageCA.5.1.1
dc.source.endpageCA.5.1.7
dc.source.conferenceInternational Reliability Physics Symposium - IRPS
dc.source.conferencedate1/06/2014
dc.source.conferencelocationWaikoloa, HI USA
dc.identifier.urlhttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?tp=&arnumber=6861122&contentType=Conference+Publications
imec.availabilityPublished - imec


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