Publication:

Study of random telegraph noise in UTBOX silicon-on-insulator nMOSFETs

Date

Loading...
Thumbnail Image

Abstract

Description

Metrics

Views

1936 since deposited on 2021-10-22
2last month
1last week
Acq. date: 2026-01-09

Citations

Metrics

Views

1936 since deposited on 2021-10-22
2last month
1last week
Acq. date: 2026-01-09

Citations