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A novel approach of using STM and NC-AFM to study narrow trenches in an oxide matrix
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Authors
Mannarino, Manuel
;
Chintala, Ravi Chandra
;
Eyben, Pierre
;
Vandervorst, Wilfried
Conference
17th International Conference on Non-Contact Atomic Force Microscopy - NC-AFM
Title
A novel approach of using STM and NC-AFM to study narrow trenches in an oxide matrix
Publication type
Meeting abstract
Embargo date
9999-12-31
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