Authors

Mannarino, Manuel; Eyben, Pierre; Chintala, Ravi Chandra; Merckling, Clement; van Dorp, Dennis; Vandervorst, Wilfried

Conference

MRS Spring Meeting Symposium BBB: Advances in Scanning Probe Microscopy for Material Properties

Title

Characterization of InP growth in nm-sized trenches by a combination of NC-AFM and STM

Publication type

Meeting abstract