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Design, test generation, processing, and pre- and post-bond measurement results of a 3D-DfT demonstrator chip stack
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Authors
Marinissen, Erik Jan
;
De Wachter, Bart
;
O'Loughlin, Stephen
;
Deutsch, Sergej
;
Papameletis, Christos
;
Burgherr, Tobias
Conference
Design, Automation, and Test in Europe - DATE': Friday Workshop on 3D Integration
Title
Design, test generation, processing, and pre- and post-bond measurement results of a 3D-DfT demonstrator chip stack
Publication type
Oral presentation
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