Authors

Meneghini, Matteo; Bisi, Davide; Stoffels, Steve; Marcon, Denis; Van Hove, Marleen; Wu, Tian-Li; Decoutere, Stefaan; Meneghesso, Gaudenzio; Zanoni, Enrico

Conference

International Workshop on Nitride Semiconductors - IWN

Title

Investigation of the impact of hot electrons and high drain bias on the dynamic Ron increase in GaN-based MIS-HEMTs grown on silicon

Publication type

Meeting abstract