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Study on processing step uniformity tuning during FET fabrication and sensor wafer response as a function of chuck temperature adjustment
Publication:
Study on processing step uniformity tuning during FET fabrication and sensor wafer response as a function of chuck temperature adjustment
Date
2014
Journal article
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Milenin, Alexey
;
Boullart, Werner
;
Wen, Youxian
;
Quli, Farhat
Journal
Japanese Journal of Applied Physics
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1873
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Acq. date: 2025-10-29
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Metrics
Views
1873
since deposited on 2021-10-22
2
last week
Acq. date: 2025-10-29
Citations