Publication:
Quantification of high-K nanolayers for semiconductor applications using synchrotron radiation and calibrated instrumentation
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1946 since deposited on 2021-10-22
2last month
Acq. date: 2026-09-20
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Statistics
Views
1946 since deposited on 2021-10-22
2last month
Acq. date: 2026-09-20
Citations