Border traps in InGaAs nMOSFETs assessed by low-frequency noise

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Authors

Scarpino, Mercedes; Gupta, Somya; Lin, Dennis; Alian, AliReza; Crupi, Felice; Collaert, Nadine; Thean, Aaron; Simoen, Eddy

ISSN

0741-3106

Issue

7

Journal

IEEE Electron Device Letters

Volume

35

Title

Border traps in InGaAs nMOSFETs assessed by low-frequency noise

Publication type

Journal article

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