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Border traps in InGaAs nMOSFETs assessed by low-frequency noise
Publication:
Border traps in InGaAs nMOSFETs assessed by low-frequency noise
Date
2014
Journal article
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Scarpino, Mercedes
;
Gupta, Somya
;
Lin, Dennis
;
Alian, AliReza
;
Crupi, Felice
;
Collaert, Nadine
;
Thean, Aaron
;
Simoen, Eddy
Journal
IEEE Electron Device Letters
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1974
since deposited on 2021-10-22
Acq. date: 2025-10-23
Citations
Metrics
Views
1974
since deposited on 2021-10-22
Acq. date: 2025-10-23
Citations