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Deep-level transient spectroscopic study of quenched-in defects in germanium

dc.contributor.authorSegers, Siegfried
dc.contributor.authorLauwaert, Johan
dc.contributor.authorClauws, Paul
dc.contributor.authorCallens, Freddy
dc.contributor.authorVanhellemont, Jan
dc.contributor.authorSimoen, Eddy
dc.contributor.authorVrielinck, Henk
dc.date.accessioned2021-10-22T05:38:20Z
dc.date.available2021-10-22T05:38:20Z
dc.date.issued2014
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/24501
dc.sourceIIOimport
dc.titleDeep-level transient spectroscopic study of quenched-in defects in germanium
dc.typeOral presentation
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.source.peerreviewno
dc.source.conferenceEMRS Spring Meeting Symposium X: Materials Research for Group IV Semiconductors
dc.source.conferencedate26/05/2014
dc.source.conferencelocationLille France
imec.availabilityPublished - imec


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