Show simple item record

TEM analysis and electrical probing on thin TEM lamellas of CBRAM stacks

dc.contributor.authorSeidel, Felix
dc.contributor.authorRichard, Olivier
dc.contributor.authorBender, Hugo
dc.contributor.authorHantschel, Thomas
dc.contributor.authorGoux, Ludovic
dc.contributor.authorJurczak, Gosia
dc.contributor.authorVandervorst, Wilfried
dc.date.accessioned2021-10-22T05:39:14Z
dc.date.available2021-10-22T05:39:14Z
dc.date.issued2014
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/24503
dc.sourceIIOimport
dc.titleTEM analysis and electrical probing on thin TEM lamellas of CBRAM stacks
dc.typeOral presentation
dc.contributor.imecauthorSeidel, Felix
dc.contributor.imecauthorRichard, Olivier
dc.contributor.imecauthorBender, Hugo
dc.contributor.imecauthorHantschel, Thomas
dc.contributor.imecauthorGoux, Ludovic
dc.contributor.imecauthorJurczak, Gosia
dc.contributor.imecauthorVandervorst, Wilfried
dc.contributor.orcidimecRichard, Olivier::0000-0002-3994-8021
dc.contributor.orcidimecHantschel, Thomas::0000-0001-9476-4084
dc.contributor.orcidimecGoux, Ludovic::0000-0002-1276-2278
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.conference18th International Microscopy Conference - IMC
dc.source.conferencedate7/09/2014
dc.source.conferencelocationPrague Czech Republic
imec.availabilityPublished - open access
imec.internalnotesMS-8-P-3339


Files in this item

Thumbnail
Name:
31698.pdf
Size:
125.9Kb
Format:
PDF
View/open

This item appears in the following collection(s)

Show simple item record