Show simple item record

Impact of off state stress on advanced high-K metal gate NMOSFETs

dc.contributor.authorSpessot, Alessio
dc.contributor.authorAoulaiche, Marc
dc.contributor.authorCho, Moon Ju
dc.contributor.authorFranco, Jacopo
dc.contributor.authorSchram, Tom
dc.contributor.authorRitzenthaler, Romain
dc.contributor.authorKaczer, Ben
dc.date.accessioned2021-10-22T06:05:29Z
dc.date.available2021-10-22T06:05:29Z
dc.date.issued2014
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/24556
dc.sourceIIOimport
dc.titleImpact of off state stress on advanced high-K metal gate NMOSFETs
dc.typeProceedings paper
dc.contributor.imecauthorSpessot, Alessio
dc.contributor.imecauthorFranco, Jacopo
dc.contributor.imecauthorSchram, Tom
dc.contributor.imecauthorRitzenthaler, Romain
dc.contributor.imecauthorKaczer, Ben
dc.contributor.orcidimecFranco, Jacopo::0000-0002-7382-8605
dc.contributor.orcidimecSchram, Tom::0000-0003-1533-7055
dc.contributor.orcidimecRitzenthaler, Romain::0000-0002-8615-3272
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage365
dc.source.endpage368
dc.source.conference40th European Solid State Device Research Conference - ESSDERC
dc.source.conferencedate22/09/2014
dc.source.conferencelocationVenice Italy
dc.identifier.urlhttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?tp=&arnumber=6948836&contentType=Conference+Publications
imec.availabilityPublished - open access


Files in this item

Thumbnail
Name:
29647.pdf
Size:
3.019Mb
Format:
PDF
View/open

This item appears in the following collection(s)

Show simple item record