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XPS study of the cleaning efficiency by ozone processes of protective films formed by reactive ion etching of Co and Ti silicides
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Authors
Conard, Thierry
;
De Gendt, Stefan
;
Baklanov, Mikhaïl
;
Vos, Rita
;
Heyns, Marc
;
Vandervorst, Wilfried
Conference
4th International Symposium on Ultra Clean Processing of Silicon Surfaces - UCPSS
Title
XPS study of the cleaning efficiency by ozone processes of protective films formed by reactive ion etching of Co and Ti silicides
Publication type
Oral presentation
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