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Accurate characterization of some radiative EMC phenomena at chip level, using dedicated EMC-testchips

dc.contributor.authorCriel, Steven
dc.contributor.authorBonjean, F.
dc.contributor.authorDe Smedt, R.
dc.contributor.authorDe Moerloose, Jan
dc.contributor.authorMartens, Luc
dc.contributor.authorOlyslager, Frank
dc.contributor.authorDe Zutter, Daniel
dc.date.accessioned2021-09-30T11:37:12Z
dc.date.available2021-09-30T11:37:12Z
dc.date.issued1998
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/2466
dc.sourceIIOimport
dc.titleAccurate characterization of some radiative EMC phenomena at chip level, using dedicated EMC-testchips
dc.typeProceedings paper
dc.contributor.imecauthorMartens, Luc
dc.contributor.imecauthorDe Zutter, Daniel
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage734
dc.source.endpage738
dc.source.conferenceInternational Symposium on Electromagnetic Compatibility. Symposium Record
dc.source.conferencedate24/08/1998
dc.source.conferencelocationDenver, CO USA
imec.availabilityPublished - open access


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