Authors

Weckx, Pieter; Kaczer, Ben; Kukner, Halil; Roussel, Philippe; Raghavan, Praveen; Catthoor, Francky; Groeseneken, Guido

Conference

International Reliability Physics Symposium - IRPS

Title

Non-Monte-Carlo methodology for high-sigma simulations of circuits under workload-dependent BTI degradation – application to 6T SRAM

Publication type

Proceedings paper

Embargo date

9999-12-31