Publication:

Towards the understanding of intrinsic degradation and breakdown of SiOCH low-k dielectrics

Date

Loading...
Thumbnail Image

Abstract

Description

Statistics

Views

1842 since deposited on 2021-10-22
Acq. date: 2026-02-27

Citations

Statistics

Views

1842 since deposited on 2021-10-22
Acq. date: 2026-02-27

Citations