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STT-MRAM cell design with partial source line planes: improving the trade-off between area and series resistance
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Authors
Appeltans, Raf
;
Cosemans, Stefan
;
Raghavan, Praveen
;
Verkest, Diederik
;
Van der Perre, Liesbet
;
Dehaene, Wim
Conference
IEEE Non-Volatile Memory System and Applications Symposium - NVMSA
Title
STT-MRAM cell design with partial source line planes: improving the trade-off between area and series resistance
Publication type
Proceedings paper
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