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N7 logic via patterning using templated DSA: implementation aspects
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Authors
Bekaert, Joost
;
Doise, Jan
;
Gronheid, Roel
;
Ryckaert, Julien
;
Vandenberghe, Geert
;
Fenger, Germain
;
Her, YoungJun
;
Cao, Yi
Conference
Photomask Japan 2015: Photomask and Next-Generation Lithography Mask Technology XXII
Title
N7 logic via patterning using templated DSA: implementation aspects
Publication type
Proceedings paper
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