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Surface contamination and electrical damage by focused ion beam: conditions applicable to the extraction of TEM lamellae from nano-electronic devices
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1959 since deposited on 2021-10-22
2last month
Acq. date: 2026-01-09
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Metrics
Views
1959 since deposited on 2021-10-22
2last month
Acq. date: 2026-01-09
Citations