Authors

Buffiere, Marie; ElAnzeery, Hossam; Oueslati, Souhaib; Ben Messaoud, Khaled; Brammertz, Guy; Meuris, Marc; Poortmans, Jef

ISSN

0040-6090

Journal

Thin Solid Films

Volume

582

Title

Physical characterization of Cu2ZnGeSe4 thin films from annealing of Cu-Zn-Ge precursor layers

Publication type

Journal article

Embargo date

9999-12-31