Authors

Chaudhary, Ankush; Kaczer, Ben; Roussel, Philippe; Chiarella, Thomas; Horiguchi, Naoto; Mahapatra, Souvik

Conference

IEEE International Reliability Physics Symposium - IRPS

Title

Time dependent variability in RMG-HKMG FinFETs: impact of extraction scheme on stochastic NBTI

Publication type

Proceedings paper

Embargo date

9999-12-31