dc.contributor.author | De Witte, Hilde | |
dc.contributor.author | Conard, Thierry | |
dc.contributor.author | Gouttebaron, R. | |
dc.contributor.author | Magnee, R. | |
dc.contributor.author | Caudano, R. | |
dc.contributor.author | Vandervorst, Wilfried | |
dc.contributor.author | Gijbels, Toon | |
dc.date.accessioned | 2021-09-30T11:44:48Z | |
dc.date.available | 2021-09-30T11:44:48Z | |
dc.date.issued | 1998 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/2510 | |
dc.source | IIOimport | |
dc.title | Ion induced oxidation of silicon by oxygen and argon bombardment in combination with oxygen flooding | |
dc.type | Oral presentation | |
dc.contributor.imecauthor | Conard, Thierry | |
dc.contributor.imecauthor | Vandervorst, Wilfried | |
dc.contributor.orcidimec | Conard, Thierry::0000-0002-4298-5851 | |
dc.source.peerreview | no | |
dc.source.conference | SIMS Europe Workshop; 4-6 October 1998; Munster, Germany. | |
dc.source.conferencelocation | | |
imec.availability | Published - imec | |