Authors

Croes, Kristof; Wu, Chen; Kocaay, Deniz; Boemmels, Juergen; Tokei, Zsolt

Conference

IEEE International Interconnect Technology Conference - IITC / Materials for Advanced Metallization Conference - MAM

Title

Reliability mechanisms and lifetime extrapolation methods for scaled interconnect technologies

Publication type

Proceedings paper

Embargo date

9999-12-31