Authors

Deckers, Jan; Debucquoy, Maarten; Gordon, Ivan; Mertens, Robert; Poortmans, Jef

ISSN

2156-3381

Issue

3

Journal

IEEE Journal of Photovoltaics

Volume

5

Title

Excess carrier density variations in test structures for photoconductance-based contact recombination current measurements

Publication type

Journal article

Embargo date

9999-12-31