Robust optimization of test-access architectures under realistic scenarios

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Authors

Deutsch, Sergej; Chakrabarty, Krishnendu; Marinissen, Erik Jan

ISSN

0278-0070

Issue

11

Journal

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD)

Volume

34

Title

Robust optimization of test-access architectures under realistic scenarios

Publication type

Journal article

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