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dc.contributor.authorDevulder, Wouter
dc.contributor.authorOpsomer, Karl
dc.contributor.authorJurczak, Gosia
dc.contributor.authorGoux, Ludovic
dc.contributor.authorDetavernier, Christophe
dc.date.accessioned2021-10-22T19:00:52Z
dc.date.available2021-10-22T19:00:52Z
dc.date.issued2015
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/25199
dc.sourceIIOimport
dc.titleInfluence of alloying the copper supply layer on the retention of CBRAM
dc.typeProceedings paper
dc.contributor.imecauthorDevulder, Wouter
dc.contributor.imecauthorOpsomer, Karl
dc.contributor.imecauthorJurczak, Gosia
dc.contributor.imecauthorGoux, Ludovic
dc.contributor.orcidimecDevulder, Wouter::0000-0002-5156-0177
dc.contributor.orcidimecGoux, Ludovic::0000-0002-1276-2278
dc.source.peerreviewyes
dc.source.beginpage215
dc.source.endpage218
dc.source.conferenceIEEE International Interconnect Technology Conference - IITC / Materials for Advanced Metallization Conference - MAM
dc.source.conferencedate18/05/2015
dc.source.conferencelocationGrenoble France
imec.availabilityPublished - imec


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