Authors

Degraeve, Robin; Ogier, Jean-Luc; Bellens, Rudi; Roussel, Philippe; Groeseneken, Guido; Maes, Herman

Issue

2

Journal

IEEE Trans. Electron Devices

Volume

45

Title

A new model for the field dependence of intrinsic and extrinsic time-dependent dielectric breakdown

Publication type

Journal article

Embargo date

9999-12-31