dc.contributor.author | Fang, Wen | |
dc.contributor.author | Simoen, Eddy | |
dc.contributor.author | Arimura, Hiroaki | |
dc.contributor.author | Mitard, Jerome | |
dc.contributor.author | Thean, Aaron | |
dc.contributor.author | Luo, Jun | |
dc.contributor.author | Zhao, Chao | |
dc.contributor.author | Claeys, Cor | |
dc.date.accessioned | 2021-10-22T19:13:25Z | |
dc.date.available | 2021-10-22T19:13:25Z | |
dc.date.issued | 2015 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/25263 | |
dc.source | IIOimport | |
dc.title | Low-frequency noise study of Ge pMOSFETs with HfO2/Al2O3/GeOx gate stack | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Simoen, Eddy | |
dc.contributor.imecauthor | Arimura, Hiroaki | |
dc.contributor.imecauthor | Mitard, Jerome | |
dc.contributor.imecauthor | Thean, Aaron | |
dc.contributor.orcidimec | Simoen, Eddy::0000-0002-5218-4046 | |
dc.contributor.orcidimec | Mitard, Jerome::0000-0002-7422-079X | |
dc.source.peerreview | yes | |
dc.source.beginpage | 1 | |
dc.source.endpage | 4 | |
dc.source.conference | International Conference on Noise and Fluctuations - ICNF | |
dc.source.conferencedate | 2/06/2015 | |
dc.source.conferencelocation | Xi'an China | |
dc.identifier.url | http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=7288633 | |
imec.availability | Published - imec | |