Publication:
Low-frequency noise study of Ge pMOSFETs with HfO2/Al2O3/GeOx gate stack
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1912 since deposited on 2021-10-22
2last month
Acq. date: 2025-12-10
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Views
1912 since deposited on 2021-10-22
2last month
Acq. date: 2025-12-10
Citations