Publication:
Low-frequency noise study of Ge pMOSFETs with HfO2/Al2O3/GeOx gate stack
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1920 since deposited on 2021-10-22
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Acq. date: 2026-08-09
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Views
1920 since deposited on 2021-10-22
3last month
2last week
Acq. date: 2026-08-09
Citations