Publication:
Low-frequency noise study of Ge pMOSFETs with HfO2/Al2O3/GeOx gate stack
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1918 since deposited on 2021-10-22
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Acq. date: 2026-07-18
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Views
1918 since deposited on 2021-10-22
1last month
1last week
Acq. date: 2026-07-18
Citations