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Low-frequency noise study of Ge pMOSFETs with HfO2/Al2O3/GeOx gate stack

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1908 since deposited on 2021-10-22
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Acq. date: 2025-10-24

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1908 since deposited on 2021-10-22
418item.page.metrics.field.last-week
Acq. date: 2025-10-24

Citations